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The NASA Ionospheric Connection Explorer Extreme Ultraviolet spectrograph, ICON EUV, will measure altitude profiles of the daytime extreme-ultraviolet (EUV) OII emission near 83.4 and 61.7\ nm that are used to determine density profiles and state parameters of the ionosphere. This paper describes the algorithm concept and approach to inverting these measured OII emission profiles to derive the associated O+ density profile from 150\textendash450\ km as a proxy for the electron content in the F-region of the iono ...
Published by: Space Science Reviews Published on: 10/2017
YEAR: 2017   DOI: 10.1007/s11214-017-0385-1